%0 Conference Paper %1 conf/vts/YuW19 %A Yu, Liting %A Wang, Xiaoxiao %B VTS %D 2019 %I IEEE %K dblp %P 1-6 %T ZeroScreen: A Novel Structure for IC Reliability Screening at Time-Zero. %U http://dblp.uni-trier.de/db/conf/vts/vts2019.html#YuW19 %@ 978-1-7281-1170-4

@inproceedings{conf/vts/YuW19, added-at = {2019-07-15T00:00:00.000+0200}, author = {Yu, Liting and Wang, Xiaoxiao}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/20b6c668c273b7076766cf152c1ac0f25/dblp}, booktitle = {VTS}, crossref = {conf/vts/2019}, ee = {https://doi.org/10.1109/VTS.2019.8758645}, interhash = {f87d11d667c7161ec941bf25f1be35f5}, intrahash = {0b6c668c273b7076766cf152c1ac0f25}, isbn = {978-1-7281-1170-4}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2019-09-27T17:39:17.000+0200}, title = {ZeroScreen: A Novel Structure for IC Reliability Screening at Time-Zero.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2019.html#YuW19}, year = 2019 }