%0 Journal Article %1 journals/tcad/BeattieP99 %A Beattie, Michael W. %A Pileggi, Lawrence T. %D 1999 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 3 %P 311-321 %T Error bounds for capacitance extraction via window techniques. %U http://dblp.uni-trier.de/db/journals/tcad/tcad18.html#BeattieP99 %V 18

@article{journals/tcad/BeattieP99, added-at = {2016-03-18T00:00:00.000+0100}, author = {Beattie, Michael W. and Pileggi, Lawrence T.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d4e09725648c5863148c85d668522926/dblp}, ee = {http://dx.doi.org/10.1109/43.748161}, interhash = {f6a2ca2b866aa6c0fab508984a31b6f8}, intrahash = {d4e09725648c5863148c85d668522926}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 3, pages = {311-321}, timestamp = {2016-03-19T10:32:57.000+0100}, title = {Error bounds for capacitance extraction via window techniques.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad18.html#BeattieP99}, volume = 18, year = 1999 }