%0 Conference Paper %1 conf/icnidc/LinW21 %A Lin, Jiangnan %A Wu, Qiuxin %B IC-NIDC %D 2021 %I IEEE %K dblp %P 489-493 %T A Security Integrated Attestation Scheme for Embedded Devices. %U http://dblp.uni-trier.de/db/conf/icnidc/icnidc2021.html#LinW21 %@ 978-1-6654-0582-9

@inproceedings{conf/icnidc/LinW21, added-at = {2022-01-12T00:00:00.000+0100}, author = {Lin, Jiangnan and Wu, Qiuxin}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/274bc3cda1d3d6e6bb6b6d072c08c08ed/dblp}, booktitle = {IC-NIDC}, crossref = {conf/icnidc/2021}, ee = {https://doi.org/10.1109/IC-NIDC54101.2021.9660438}, interhash = {f305451b7712e32c7f421a4d88d69aca}, intrahash = {74bc3cda1d3d6e6bb6b6d072c08c08ed}, isbn = {978-1-6654-0582-9}, keywords = {dblp}, pages = {489-493}, publisher = {IEEE}, timestamp = {2022-03-01T06:54:34.000+0100}, title = {A Security Integrated Attestation Scheme for Embedded Devices.}, url = {http://dblp.uni-trier.de/db/conf/icnidc/icnidc2021.html#LinW21}, year = 2021 }