%0 Journal Article %1 journals/tc/NairTA78 %A Nair, Ravindra %A Thatte, Satish M. %A Abraham, Jacob A. %D 1978 %J IEEE Trans. Computers %K dblp %N 6 %P 572-576 %T Efficient Algorithms for Testing Semiconductor Random-Access Memories. %U http://dblp.uni-trier.de/db/journals/tc/tc27.html#NairTA78 %V 27

@article{journals/tc/NairTA78, added-at = {2015-12-22T00:00:00.000+0100}, author = {Nair, Ravindra and Thatte, Satish M. and Abraham, Jacob A.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2438353a900ddcfe3d0822f003b3d8c5f/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TC.1978.1675150}, interhash = {ea52f74462a6ffa5d0b797b9ad8a1393}, intrahash = {438353a900ddcfe3d0822f003b3d8c5f}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 6, pages = {572-576}, timestamp = {2016-02-02T02:37:02.000+0100}, title = {Efficient Algorithms for Testing Semiconductor Random-Access Memories.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc27.html#NairTA78}, volume = 27, year = 1978 }