%0 Journal Article %1 journals/mr/ChenGSZNLT15 %A Chen, Fen %A Graas, Carole %A Shinosky, Michael A. %A Zhao, Kai %A Narasimha, Shreesh %A Liu, Xiao Hu %A Tian, Chunyan %D 2015 %J Microelectronics Reliability %K dblp %N 12 %P 2727-2747 %T Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#ChenGSZNLT15 %V 55

@article{journals/mr/ChenGSZNLT15, added-at = {2016-03-08T00:00:00.000+0100}, author = {Chen, Fen and Graas, Carole and Shinosky, Michael A. and Zhao, Kai and Narasimha, Shreesh and Liu, Xiao Hu and Tian, Chunyan}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2aa442aa093845785eb60d45876fec9cc/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2015.09.017}, interhash = {e98401bcf367cdf2508dc2afef31ffe8}, intrahash = {aa442aa093845785eb60d45876fec9cc}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 12, pages = {2727-2747}, timestamp = {2016-03-09T10:31:52.000+0100}, title = {Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#ChenGSZNLT15}, volume = 55, year = 2015 }