%0 Journal Article %1 journals/mr/MuraVSCF03 %A Mura, Giovanna %A Vanzi, Massimo %A Stangoni, Maria %A Ciappa, Mauro %A Fichtner, Wolfgang %D 2003 %J Microelectronics Reliability %K dblp %N 9-11 %P 1771-1776 %T On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#MuraVSCF03 %V 43

@article{journals/mr/MuraVSCF03, added-at = {2015-02-05T00:00:00.000+0100}, author = {Mura, Giovanna and Vanzi, Massimo and Stangoni, Maria and Ciappa, Mauro and Fichtner, Wolfgang}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22c0310938b114f477b0f2e497bd2fbdb/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(03)00298-1}, interhash = {e913a1e5067136dc7af39d64e9f79a86}, intrahash = {2c0310938b114f477b0f2e497bd2fbdb}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1771-1776}, timestamp = {2016-02-02T02:02:32.000+0100}, title = {On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#MuraVSCF03}, volume = 43, year = 2003 }