%0 Journal Article %1 journals/vlsi/RochaMCWS08 %A Rocha, Luís Alexandre %A Mol, Lukas %A Cretu, Edmond %A Wolffenbuttel, Reinoud F. %A da Silva, José Machado %D 2008 %J VLSI Design %K dblp %P 283451:1-283451:7 %T A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization. %U http://dblp.uni-trier.de/db/journals/vlsi/vlsi2008.html#RochaMCWS08 %V 2008

@article{journals/vlsi/RochaMCWS08, added-at = {2018-11-24T00:00:00.000+0100}, author = {Rocha, Luís Alexandre and Mol, Lukas and Cretu, Edmond and Wolffenbuttel, Reinoud F. and da Silva, José Machado}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/225827b7f862138021681e07b39d5fd5e/dblp}, ee = {https://www.wikidata.org/entity/Q58646440}, interhash = {dfd37810185836c0b7c063f5a315d431}, intrahash = {25827b7f862138021681e07b39d5fd5e}, journal = {VLSI Design}, keywords = {dblp}, pages = {283451:1-283451:7}, timestamp = {2019-09-27T06:27:52.000+0200}, title = {A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization.}, url = {http://dblp.uni-trier.de/db/journals/vlsi/vlsi2008.html#RochaMCWS08}, volume = 2008, year = 2008 }