%0 Journal Article %1 journals/mr/ChenFHBL16 %A Chen, W. %A Franke, Jörg %A Herold, Christian %A Bhojani, Riteshkumar %A Lutz, Josef %D 2016 %J Microelectronics Reliability %K dblp %P 464-468 %T Internal processes in power semiconductors at virtual junction temperature measurement. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChenFHBL16 %V 64

@article{journals/mr/ChenFHBL16, added-at = {2016-12-22T00:00:00.000+0100}, author = {Chen, W. and Franke, Jörg and Herold, Christian and Bhojani, Riteshkumar and Lutz, Josef}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2900816e2431cee36b176db9edd119b5f/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2016.07.125}, interhash = {d143ed1aac3d60dce567314bb5e9d092}, intrahash = {900816e2431cee36b176db9edd119b5f}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {464-468}, timestamp = {2016-12-23T10:32:43.000+0100}, title = {Internal processes in power semiconductors at virtual junction temperature measurement.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChenFHBL16}, volume = 64, year = 2016 }