%0 Journal Article %1 Fink_ECCEEurope2025 %A Fink, T. %A Schmalzried, T. %A Kuderna-Melgar, D. %A Schnitzler, R. %A Koch, D. %A Kallfass, I. %D 2025 %J in Proc. ECCE Europe, Birmingham %K imported %T Machine Learning-Based Degradation State Prediction of SiC MOSFETs Aged by Static Power Cycling Tests

@article{Fink_ECCEEurope2025, added-at = {2025-05-26T10:46:09.000+0200}, author = {Fink, T. and Schmalzried, T. and Kuderna-Melgar, D. and Schnitzler, R. and Koch, D. and Kallfass, I.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2426d5e8b1049865bfa5241fa3b917d84/ingmarkallfass}, date-added = {2025-02-20 20:30:34 +0100}, date-modified = {2025-02-20 20:31:36 +0100}, interhash = {ce364f58e57fd7f356ee7d1bf6316812}, intrahash = {426d5e8b1049865bfa5241fa3b917d84}, journal = {in Proc. ECCE Europe, Birmingham}, keywords = {imported}, timestamp = {2025-05-26T10:46:09.000+0200}, title = {Machine Learning-Based Degradation State Prediction of SiC MOSFETs Aged by Static Power Cycling Tests}, year = 2025 }