%0 Conference Paper %1 conf/iscas/AsenovDRAAAG15 %A Asenov, A. %A Ding, Jie %A Reid, Dave %A Asenov, Plamen %A Amoroso, Salvatore M. %A Adamu-Lema, Fikru %A Gerrer, Louis %B ISCAS %D 2015 %I IEEE %K dblp %P 2449-2452 %T Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2015.html#AsenovDRAAAG15 %@ 978-1-4799-8391-9

@inproceedings{conf/iscas/AsenovDRAAAG15, added-at = {2015-08-05T00:00:00.000+0200}, author = {Asenov, A. and Ding, Jie and Reid, Dave and Asenov, Plamen and Amoroso, Salvatore M. and Adamu-Lema, Fikru and Gerrer, Louis}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/28134d1269b4f91c13db42096da983cf6/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/2015}, ee = {http://dx.doi.org/10.1109/ISCAS.2015.7169180}, interhash = {c45c261667396a059fff38c45b6ef782}, intrahash = {8134d1269b4f91c13db42096da983cf6}, isbn = {978-1-4799-8391-9}, keywords = {dblp}, pages = {2449-2452}, publisher = {IEEE}, timestamp = {2016-02-02T12:21:48.000+0100}, title = {Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2015.html#AsenovDRAAAG15}, year = 2015 }