%0 Journal Article %1 journals/tvlsi/BahukudumbiOCI09 %A Bahukudumbi, Sudarshan %A Ozev, Sule %A Chakrabarty, Krishnendu %A Iyengar, Vikram %D 2009 %J IEEE Trans. VLSI Syst. %K dblp %N 4 %P 587-592 %T Wafer-Level Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi17.html#BahukudumbiOCI09 %V 17

@article{journals/tvlsi/BahukudumbiOCI09, added-at = {2010-11-16T00:00:00.000+0100}, author = {Bahukudumbi, Sudarshan and Ozev, Sule and Chakrabarty, Krishnendu and Iyengar, Vikram}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d4abd19fb2c0f2e119307aff8d0ff4d9/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2008.2006075}, interhash = {c44b0f1abd8bc21fabcd54728ac5342a}, intrahash = {d4abd19fb2c0f2e119307aff8d0ff4d9}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 4, pages = {587-592}, timestamp = {2016-02-02T02:13:05.000+0100}, title = {Wafer-Level Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi17.html#BahukudumbiOCI09}, volume = 17, year = 2009 }