%0 Conference Paper %1 conf/itc/PandeyH98 %A Pandey, Rajiv %A Higgins, Dan %B ITC %D 1998 %I IEEE Computer Society %K dblp %P 836-842 %T probe card-a solution for at-speed, high density, wafer probing. %U http://dblp.uni-trier.de/db/conf/itc/itc1998.html#PandeyH98 %@ 0-7803-5093-6

@inproceedings{conf/itc/PandeyH98, added-at = {2015-08-26T00:00:00.000+0200}, author = {Pandey, Rajiv and Higgins, Dan}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27915347e2c3f06719a08cf204647f778/dblp}, booktitle = {ITC}, crossref = {conf/itc/1998}, ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.1998.743271}, interhash = {c10a4d2155130619e9683357b35e3022}, intrahash = {7915347e2c3f06719a08cf204647f778}, isbn = {0-7803-5093-6}, keywords = {dblp}, pages = {836-842}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:31:46.000+0100}, title = {probe card-a solution for at-speed, high density, wafer probing.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1998.html#PandeyH98}, year = 1998 }