4.7 A 409GOPS/W adaptive and resilient domino register file in 22nm tri-gate CMOS featuring in-situ timing margin and error detection for tolerance to within-die variation, voltage droop, temperature and aging.
Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 conf/isscc/KulkarniTANATD15
%A Kulkarni, Jaydeep P.
%A Tokunaga, Carlos
%A Aseron, Paolo A.
%A Nguyen, Trang
%A Augustine, Charles
%A Tschanz, James
%A De, Vivek
%B ISSCC
%D 2015
%I IEEE
%K dblp
%P 1-3
%T 4.7 A 409GOPS/W adaptive and resilient domino register file in 22nm tri-gate CMOS featuring in-situ timing margin and error detection for tolerance to within-die variation, voltage droop, temperature and aging.
%U http://dblp.uni-trier.de/db/conf/isscc/isscc2015.html#KulkarniTANATD15
%@ 978-1-4799-6224-2
@inproceedings{conf/isscc/KulkarniTANATD15,
added-at = {2015-03-24T00:00:00.000+0100},
author = {Kulkarni, Jaydeep P. and Tokunaga, Carlos and Aseron, Paolo A. and Nguyen, Trang and Augustine, Charles and Tschanz, James and De, Vivek},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/24165885d7cf931d1024e1af769a289c8/dblp},
booktitle = {ISSCC},
crossref = {conf/isscc/2015},
ee = {http://dx.doi.org/10.1109/ISSCC.2015.7062936},
interhash = {bd3c92befbb85bdbaddf65fd4323fc7b},
intrahash = {4165885d7cf931d1024e1af769a289c8},
isbn = {978-1-4799-6224-2},
keywords = {dblp},
pages = {1-3},
publisher = {IEEE},
timestamp = {2016-02-02T12:13:06.000+0100},
title = {4.7 A 409GOPS/W adaptive and resilient domino register file in 22nm tri-gate CMOS featuring in-situ timing margin and error detection for tolerance to within-die variation, voltage droop, temperature and aging.},
url = {http://dblp.uni-trier.de/db/conf/isscc/isscc2015.html#KulkarniTANATD15},
year = 2015
}
