%0 Journal Article %1 journals/mr/BafleurPMFN15 %A Bafleur, Marise %A Perdu, Philippe %A Marc, François %A Frémont, Hélène %A Nolhier, Nicolas %D 2015 %J Microelectronics Reliability %K dblp %N 9-10 %P 1269-1270 %T Editorial. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#BafleurPMFN15 %V 55

@article{journals/mr/BafleurPMFN15, added-at = {2015-10-31T00:00:00.000+0100}, author = {Bafleur, Marise and Perdu, Philippe and Marc, François and Frémont, Hélène and Nolhier, Nicolas}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/20f2dd9ffeb1ebac5475ba3b2fce6eb8a/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2015.09.028}, interhash = {b56eadd8a48d1db29256d84863bd025d}, intrahash = {0f2dd9ffeb1ebac5475ba3b2fce6eb8a}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-10}, pages = {1269-1270}, timestamp = {2016-02-02T02:01:27.000+0100}, title = {Editorial.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#BafleurPMFN15}, volume = 55, year = 2015 }