%0 Conference Paper %1 conf/irps/IllarionovWSVOM15 %A Illarionov, Yury %A Waltl, Michael %A Smith, Anderson D. %A Vaziri, Sam %A Östling, Mikael %A Mueller, T. %A Lemme, Max C. %A Grasser, Tibor %B IRPS %D 2015 %I IEEE %K dblp %P 2 %T Hot-carrier degradation in single-layer double-gated graphene field-effect transistors. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#IllarionovWSVOM15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/IllarionovWSVOM15, added-at = {2019-09-25T00:00:00.000+0200}, author = {Illarionov, Yury and Waltl, Michael and Smith, Anderson D. and Vaziri, Sam and Östling, Mikael and Mueller, T. and Lemme, Max C. and Grasser, Tibor}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/218aa7da791f838a314c9db144e74c053/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112834}, interhash = {b1a82801ca9d3b69b5210fba6ee7a87e}, intrahash = {18aa7da791f838a314c9db144e74c053}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 2, publisher = {IEEE}, timestamp = {2019-09-27T20:20:13.000+0200}, title = {Hot-carrier degradation in single-layer double-gated graphene field-effect transistors.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#IllarionovWSVOM15}, year = 2015 }