%0 Conference Paper %1 conf/iolts/AryanLHYGS14 %A Aryan, Nasim Pour %A Listl, A. %A Heiß, Leonhard %A Yilmaz, C. %A Georgakos, Georg %A Schmitt-Landsiedel, Doris %B IOLTS %D 2014 %I IEEE %K dblp %P 19-24 %T From an analytic NBTI device model to reliability assessment of complex digital circuits. %U http://dblp.uni-trier.de/db/conf/iolts/iolts2014.html#AryanLHYGS14 %@ 978-1-4799-5323-3

@inproceedings{conf/iolts/AryanLHYGS14, added-at = {2014-09-12T00:00:00.000+0200}, author = {Aryan, Nasim Pour and Listl, A. and Heiß, Leonhard and Yilmaz, C. and Georgakos, Georg and Schmitt-Landsiedel, Doris}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/24d3283ac4544a4c772e0eb3a23ad60d4/dblp}, booktitle = {IOLTS}, crossref = {conf/iolts/2014}, ee = {http://dx.doi.org/10.1109/IOLTS.2014.6873666}, interhash = {aa3ce3325881b2b1ccf5629468395ade}, intrahash = {4d3283ac4544a4c772e0eb3a23ad60d4}, isbn = {978-1-4799-5323-3}, keywords = {dblp}, pages = {19-24}, publisher = {IEEE}, timestamp = {2016-05-20T09:33:39.000+0200}, title = {From an analytic NBTI device model to reliability assessment of complex digital circuits.}, url = {http://dblp.uni-trier.de/db/conf/iolts/iolts2014.html#AryanLHYGS14}, year = 2014 }