%0 Journal Article %1 journals/mr/PaskalevaLB07 %A Paskaleva, Albena %A Lemberger, Martin %A Bauer, Anton J. %D 2007 %J Microelectronics Reliability %K dblp %N 12 %P 2094-2099 %T Polarity asymmetry of stress and charge trapping behavior of thin Hf- and Zr-silicate layers. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#PaskalevaLB07 %V 47

@article{journals/mr/PaskalevaLB07, added-at = {2010-09-17T00:00:00.000+0200}, author = {Paskaleva, Albena and Lemberger, Martin and Bauer, Anton J.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23a8a8b6e5c521e15ad4dbe3d23747e94/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2006.11.018}, interhash = {a757e70b74185c665ceba2855ce50aa5}, intrahash = {3a8a8b6e5c521e15ad4dbe3d23747e94}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 12, pages = {2094-2099}, timestamp = {2016-02-02T02:02:06.000+0100}, title = {Polarity asymmetry of stress and charge trapping behavior of thin Hf- and Zr-silicate layers.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#PaskalevaLB07}, volume = 47, year = 2007 }