%0 Conference Paper %1 conf/nanoarch/NessHL07 %A Ness, Drew C. %A Hescott, Christian J. %A Lilja, David J. %B NANOARCH %D 2007 %I IEEE Computer Society %K dblp %P 46-53 %T Improving nanoelectronic designs using a statistical approach to identify key parameters in circuit level SEU simulations. %U http://dblp.uni-trier.de/db/conf/nanoarch/nanoarch2007.html#NessHL07 %@ 978-1-4244-1791-9

@inproceedings{conf/nanoarch/NessHL07, added-at = {2016-06-17T00:00:00.000+0200}, author = {Ness, Drew C. and Hescott, Christian J. and Lilja, David J.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22809b14b1ca237fcb2ae60af940e7907/dblp}, booktitle = {NANOARCH}, crossref = {conf/nanoarch/2007}, ee = {http://dl.acm.org/citation.cfm?id=1548934}, interhash = {a59ac917936f3223bfda84f23125bfb3}, intrahash = {2809b14b1ca237fcb2ae60af940e7907}, isbn = {978-1-4244-1791-9}, keywords = {dblp}, pages = {46-53}, publisher = {IEEE Computer Society}, timestamp = {2016-06-18T09:33:02.000+0200}, title = {Improving nanoelectronic designs using a statistical approach to identify key parameters in circuit level SEU simulations.}, url = {http://dblp.uni-trier.de/db/conf/nanoarch/nanoarch2007.html#NessHL07}, year = 2007 }