%0 Journal Article %1 journals/ieicet/NiLNXYH17 %A Ni, Tianming %A Liang, Huaguo %A Nie, Mu %A Xu, Xiumin %A Yan, Aibin %A Huang, Zhengfeng %D 2017 %J IEICE Transactions %K dblp %N 12 %P 1108-1117 %T A Region-Based Through-Silicon via Repair Method for Clustered Faults. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet100c.html#NiLNXYH17 %V 100-C

@article{journals/ieicet/NiLNXYH17, added-at = {2018-09-27T00:00:00.000+0200}, author = {Ni, Tianming and Liang, Huaguo and Nie, Mu and Xu, Xiumin and Yan, Aibin and Huang, Zhengfeng}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a7d4eb05eff697bd00314106dac582b4/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e100-c_12_1108}, interhash = {a1607679cf0eca96c865314f0bf3e717}, intrahash = {a7d4eb05eff697bd00314106dac582b4}, journal = {IEICE Transactions}, keywords = {dblp}, number = 12, pages = {1108-1117}, timestamp = {2019-09-27T07:16:38.000+0200}, title = {A Region-Based Through-Silicon via Repair Method for Clustered Faults.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet100c.html#NiLNXYH17}, volume = {100-C}, year = 2017 }