%0 Conference Paper %1 conf/itc/MitraA07 %A Mitra, Subhasish %A Agarwal, Mridul %B ITC %D 2007 %E Sibert, Jill %E Rajski, Janusz %I IEEE Computer Society %K dblp %P 1-3 %T Circuit failure prediction to overcome scaled CMOS reliability challenges. %U http://dblp.uni-trier.de/db/conf/itc/itc2007.html#MitraA07 %@ 1-4244-1128-9

@inproceedings{conf/itc/MitraA07, added-at = {2019-02-13T00:00:00.000+0100}, author = {Mitra, Subhasish and Agarwal, Mridul}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ca11c24aa1b93d6aed55c9bf0a37be13/dblp}, booktitle = {ITC}, crossref = {conf/itc/2007}, editor = {Sibert, Jill and Rajski, Janusz}, ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2007.4437665}, interhash = {8c3be1d013eb5cc780d266812f8d9b56}, intrahash = {ca11c24aa1b93d6aed55c9bf0a37be13}, isbn = {1-4244-1128-9}, keywords = {dblp}, pages = {1-3}, publisher = {IEEE Computer Society}, timestamp = {2019-09-27T17:47:26.000+0200}, title = {Circuit failure prediction to overcome scaled CMOS reliability challenges.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2007.html#MitraA07}, year = 2007 }