%0 Journal Article %1 journals/tvlsi/ChangKBKO16 %A Chang, Doohwang %A Kitchen, Jennifer N. %A Bakkaloglu, Bertan %A Kiaei, Sayfe %A Ozev, Sule %D 2016 %J IEEE Trans. VLSI Syst. %K dblp %N 3 %P 1179-1183 %T Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi24.html#ChangKBKO16 %V 24

@article{journals/tvlsi/ChangKBKO16, added-at = {2016-03-03T00:00:00.000+0100}, author = {Chang, Doohwang and Kitchen, Jennifer N. and Bakkaloglu, Bertan and Kiaei, Sayfe and Ozev, Sule}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/28816260712b67160374daf9532ae21e1/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2015.2428221}, interhash = {89ea300f8d51608c3cd61880c9cd1901}, intrahash = {8816260712b67160374daf9532ae21e1}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 3, pages = {1179-1183}, timestamp = {2016-03-04T10:31:48.000+0100}, title = {Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi24.html#ChangKBKO16}, volume = 24, year = 2016 }