In this paper, we present a novel on-chip multi-tone characterization of a millimeter-wave amplifier MMIC in a waveguide environment covering W-band frequencies. The measurement setup comprises extension modules in WR-10, where a new architecture with a wideband RF input enables source calibration. The setup is capable of measuring small-signal parameters while the same configuration is able to excite wideband multi-tone or complex modulated signals and measure the signal response for a time-domain analysis. The in-situ combination of an analog millimeter-wave frequency domain setup with digitally modulated wideband time domain entities is described as a cross-domain measurement setup. A W-band power amplifier chip is used as a device-under-test, where a multi-tone test is conducted and the response of complex modulated signals is analyzed.
%0 Conference Paper
%1 10290485
%A Schoch, Benjamin
%A Wrana, Dominik
%A Tessmann, Axel
%A Kallfass, Ingmar
%B 2023 53rd European Microwave Conference (EuMC)
%D 2023
%K CrossLink myown
%P 770-773
%R 10.23919/EuMC58039.2023.10290485
%T Wideband Cross-Domain Characterization of a W-band Amplifier MMIC
%X In this paper, we present a novel on-chip multi-tone characterization of a millimeter-wave amplifier MMIC in a waveguide environment covering W-band frequencies. The measurement setup comprises extension modules in WR-10, where a new architecture with a wideband RF input enables source calibration. The setup is capable of measuring small-signal parameters while the same configuration is able to excite wideband multi-tone or complex modulated signals and measure the signal response for a time-domain analysis. The in-situ combination of an analog millimeter-wave frequency domain setup with digitally modulated wideband time domain entities is described as a cross-domain measurement setup. A W-band power amplifier chip is used as a device-under-test, where a multi-tone test is conducted and the response of complex modulated signals is analyzed.
@inproceedings{10290485,
abstract = {In this paper, we present a novel on-chip multi-tone characterization of a millimeter-wave amplifier MMIC in a waveguide environment covering W-band frequencies. The measurement setup comprises extension modules in WR-10, where a new architecture with a wideband RF input enables source calibration. The setup is capable of measuring small-signal parameters while the same configuration is able to excite wideband multi-tone or complex modulated signals and measure the signal response for a time-domain analysis. The in-situ combination of an analog millimeter-wave frequency domain setup with digitally modulated wideband time domain entities is described as a cross-domain measurement setup. A W-band power amplifier chip is used as a device-under-test, where a multi-tone test is conducted and the response of complex modulated signals is analyzed.},
added-at = {2023-12-22T09:24:21.000+0100},
author = {Schoch, Benjamin and Wrana, Dominik and Tessmann, Axel and Kallfass, Ingmar},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26fe82e948e822b730660a5b907e03269/bschoch},
booktitle = {2023 53rd European Microwave Conference (EuMC)},
doi = {10.23919/EuMC58039.2023.10290485},
interhash = {894e410bf21afef2a0a550c80c452cdc},
intrahash = {6fe82e948e822b730660a5b907e03269},
keywords = {CrossLink myown},
month = {Sep.},
pages = {770-773},
timestamp = {2023-12-22T10:00:41.000+0100},
title = {Wideband Cross-Domain Characterization of a W-band Amplifier MMIC},
year = 2023
}
