%0 Journal Article %1 journals/jssc/RosenblattFCSRKI13 %A Rosenblatt, Sami %A Fainstein, Daniel %A Cestero, Alberto %A Safran, John %A Robson, Norman %A Kirihata, Toshiaki %A Iyer, Subramanian S. %D 2013 %J J. Solid-State Circuits %K dblp %N 4 %P 940-947 %T Field Tolerant Dynamic Intrinsic Chip ID Using 32 nm High-K/Metal Gate SOI Embedded DRAM. %U http://dblp.uni-trier.de/db/journals/jssc/jssc48.html#RosenblattFCSRKI13 %V 48

@article{journals/jssc/RosenblattFCSRKI13, added-at = {2013-04-14T00:00:00.000+0200}, author = {Rosenblatt, Sami and Fainstein, Daniel and Cestero, Alberto and Safran, John and Robson, Norman and Kirihata, Toshiaki and Iyer, Subramanian S.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2391453f9e6be4de6b6efd88accbe7fed/dblp}, ee = {http://dx.doi.org/10.1109/JSSC.2013.2239134}, interhash = {84b9dbfab72160b35ff89086b7a9e8f4}, intrahash = {391453f9e6be4de6b6efd88accbe7fed}, journal = {J. Solid-State Circuits}, keywords = {dblp}, number = 4, pages = {940-947}, timestamp = {2016-02-02T09:37:13.000+0100}, title = {Field Tolerant Dynamic Intrinsic Chip ID Using 32 nm High-K/Metal Gate SOI Embedded DRAM.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc48.html#RosenblattFCSRKI13}, volume = 48, year = 2013 }