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Simultaneous removal of nonrotationally symmetric errors in tilted wave interferometry

, , and . Optical Engineering, 58 (7): 074105 (2019)
DOI: 10.1117/1.OE.58.7.074105

Abstract

<p>The tilted wave interferometer has been developed as a fast and accurate instrument for the measurement of aspheric and freeform surfaces. We present a method for increasing its robustness and flexibility. Tilted wave interferometry crucially depends on accurate calibration and any changes to a calibrated setup require, in general, a recalibration. Therefore, we propose a method for simultaneous topography reconstruction and elimination of errors arising from such changes. An approach to identify trends in systematic errors for the complex non-null setup with a large number of blackbox model parameters is worked out. The procedure allows deriving an error removal scheme for nonrotationally symmetric components based on measurements in different rotational positions. The feasibility and benefit of the error elimination method are shown both by simulation methods and dedicated experiments. A significant reduction of systematic errors even in a miscalibrated state is achieved. Hence, recalibrations are avoided and measurement time and flexibility are improved.</p>

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