%0 Journal Article %1 journals/et/BalivadaZNCA96 %A Balivada, Ashok %A Zheng, Hong %A Nagi, Naveena %A Chatterjee, Abhijit %A Abraham, Jacob A. %D 1996 %J J. Electronic Testing %K dblp %N 1-2 %P 29-41 %T A unified approach for fault simulation of linear mixed-signal circuits. %U http://dblp.uni-trier.de/db/journals/et/et9.html#BalivadaZNCA96 %V 9

@article{journals/et/BalivadaZNCA96, added-at = {2009-03-24T00:00:00.000+0100}, author = {Balivada, Ashok and Zheng, Hong and Nagi, Naveena and Chatterjee, Abhijit and Abraham, Jacob A.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/214aca7ae4983b8a28a4f07a3b52298e8/dblp}, ee = {http://dx.doi.org/10.1007/BF00137563}, interhash = {83893df0bec99d138907f7af18a94ddd}, intrahash = {14aca7ae4983b8a28a4f07a3b52298e8}, journal = {J. Electronic Testing}, keywords = {dblp}, number = {1-2}, pages = {29-41}, timestamp = {2016-02-02T10:07:29.000+0100}, title = {A unified approach for fault simulation of linear mixed-signal circuits.}, url = {http://dblp.uni-trier.de/db/journals/et/et9.html#BalivadaZNCA96}, volume = 9, year = 1996 }