%0 Conference Paper %1 conf/date/Weis0ESVGKW15 %A Weis, Christian %A Jung, Matthias %A Ehses, Peter %A Santos, Cristiano %A Vivet, Pascal %A Goossens, Sven %A Koedam, Martijn %A Wehn, Norbert %B DATE %D 2015 %E Nebel, Wolfgang %E Atienza, David %I ACM %K dblp %P 495-500 %T Retention time measurements and modelling of bit error rates of WIDE I/O DRAM in MPSoCs. %U http://dblp.uni-trier.de/db/conf/date/date2015.html#Weis0ESVGKW15 %@ 978-3-9815370-4-8

@inproceedings{conf/date/Weis0ESVGKW15, added-at = {2015-04-28T00:00:00.000+0200}, author = {Weis, Christian and Jung, Matthias and Ehses, Peter and Santos, Cristiano and Vivet, Pascal and Goossens, Sven and Koedam, Martijn and Wehn, Norbert}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f89da59996e7dae9e439789ff85bbb83/dblp}, booktitle = {DATE}, crossref = {conf/date/2015}, editor = {Nebel, Wolfgang and Atienza, David}, ee = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7092439}, interhash = {833e816f502c69fe8584a3008e36c969}, intrahash = {f89da59996e7dae9e439789ff85bbb83}, isbn = {978-3-9815370-4-8}, keywords = {dblp}, pages = {495-500}, publisher = {ACM}, timestamp = {2016-02-02T13:24:23.000+0100}, title = {Retention time measurements and modelling of bit error rates of WIDE I/O DRAM in MPSoCs.}, url = {http://dblp.uni-trier.de/db/conf/date/date2015.html#Weis0ESVGKW15}, year = 2015 }