%0 Journal Article %1 journals/tvlsi/LeeLWEGAW17 %A Lee, Hochul %A Lee, Albert %A Wang, Shaodi %A Ebrahimi, Farbod %A Gupta, Puneet %A Amiri, Pedram Khalili %A Wang, Kang L. %D 2017 %J IEEE Trans. VLSI Syst. %K dblp %N 7 %P 2027-2034 %T A Word Line Pulse Circuit Technique for Reliable Magnetoelectric Random Access Memory. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi25.html#LeeLWEGAW17 %V 25

@article{journals/tvlsi/LeeLWEGAW17, added-at = {2018-11-02T00:00:00.000+0100}, author = {Lee, Hochul and Lee, Albert and Wang, Shaodi and Ebrahimi, Farbod and Gupta, Puneet and Amiri, Pedram Khalili and Wang, Kang L.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c5fd43679c330d8743f25f6325b792c2/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2017.2670502}, interhash = {8320a04b249a076395adc47029e68283}, intrahash = {c5fd43679c330d8743f25f6325b792c2}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 7, pages = {2027-2034}, timestamp = {2019-09-27T06:53:31.000+0200}, title = {A Word Line Pulse Circuit Technique for Reliable Magnetoelectric Random Access Memory.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi25.html#LeeLWEGAW17}, volume = 25, year = 2017 }