%0 Journal Article %1 journals/et/LiuNUS08 %A Liu, Lushan %A Nagaraj, Pradeep %A Upadhyaya, Shambhu J. %A Sridhar, Ramalingam %D 2008 %J J. Electronic Testing %K dblp %N 1-3 %P 165-179 %T Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. %U http://dblp.uni-trier.de/db/journals/et/et24.html#LiuNUS08 %V 24

@article{journals/et/LiuNUS08, added-at = {2009-11-06T00:00:00.000+0100}, author = {Liu, Lushan and Nagaraj, Pradeep and Upadhyaya, Shambhu J. and Sridhar, Ramalingam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/210b037a87e56f822e4ba8477e2a7588c/dblp}, ee = {http://dx.doi.org/10.1007/s10836-007-5023-5}, interhash = {80bd6f404f392c7d50d6efba80f81890}, intrahash = {10b037a87e56f822e4ba8477e2a7588c}, journal = {J. Electronic Testing}, keywords = {dblp}, number = {1-3}, pages = {165-179}, timestamp = {2016-02-02T10:07:24.000+0100}, title = {Defect Analysis and Defect Tolerant Design of Multi-port SRAMs.}, url = {http://dblp.uni-trier.de/db/journals/et/et24.html#LiuNUS08}, volume = 24, year = 2008 }