%0 Journal Article %1 journals/mr/SantiMCDZMZM17 %A Santi, Carlo De %A Meneghini, Matteo %A Caria, A. %A Dogmus, E. %A Zegaoui, M. %A Medjdoub, F. %A Zanoni, Enrico %A Meneghesso, Gaudenzio %D 2017 %J Microelectronics Reliability %K dblp %P 575-578 %T Degradation of InGaN-based MQW solar cells under 405 nm laser excitation. %U http://dblp.uni-trier.de/db/journals/mr/mr76.html#SantiMCDZMZM17 %V 76-77

@article{journals/mr/SantiMCDZMZM17, added-at = {2019-09-25T00:00:00.000+0200}, author = {Santi, Carlo De and Meneghini, Matteo and Caria, A. and Dogmus, E. and Zegaoui, M. and Medjdoub, F. and Zanoni, Enrico and Meneghesso, Gaudenzio}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d2693353404172fe027e8387c37dc616/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.06.072}, interhash = {8008c72a177b101e903637fc558ac862}, intrahash = {d2693353404172fe027e8387c37dc616}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {575-578}, timestamp = {2019-09-27T10:58:17.000+0200}, title = {Degradation of InGaN-based MQW solar cells under 405 nm laser excitation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr76.html#SantiMCDZMZM17}, volume = {76-77}, year = 2017 }