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%0 Journal Article
%1 journals/mr/GalbiatiGCL01
%A Galbiati, N.
%A Ghidini, G.
%A Cremonesi, C.
%A Larcher, Luca
%D 2001
%J Microelectronics Reliability
%K dblp
%N 7
%P 999-1002
%T Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling.
%U http://dblp.uni-trier.de/db/journals/mr/mr41.html#GalbiatiGCL01
%V 41
@article{journals/mr/GalbiatiGCL01,
added-at = {2016-03-07T00:00:00.000+0100},
author = {Galbiati, N. and Ghidini, G. and Cremonesi, C. and Larcher, Luca},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/24a1aefdb693dd539db2f84567a3a86b9/dblp},
ee = {http://dx.doi.org/10.1016/S0026-2714(01)00056-7},
interhash = {77c3572807247b028e39b3a5806be8bd},
intrahash = {4a1aefdb693dd539db2f84567a3a86b9},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 7,
pages = {999-1002},
timestamp = {2016-03-08T10:31:48.000+0100},
title = {Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#GalbiatiGCL01},
volume = 41,
year = 2001
}
