%0 Conference Paper %1 conf/vecims/LiauS03 %A Liau, Eric %A Schmitt-Landsiedel, Doris %B VECIMS %D 2003 %I IEEE %K dblp %P 39-44 %T Evolution of automatic semiconductor test equipment: automatic test pattern learning, classification, optimisation and generation for power supply noise. %U http://dblp.uni-trier.de/db/conf/vecims/vecims2003.html#LiauS03 %@ 0-7803-7785-0

@inproceedings{conf/vecims/LiauS03, added-at = {2013-07-22T00:00:00.000+0200}, author = {Liau, Eric and Schmitt-Landsiedel, Doris}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29ca8a48396b529181a59f18430bfd13c/dblp}, booktitle = {VECIMS}, crossref = {conf/vecims/2003}, ee = {http://dx.doi.org/10.1109/VECIMS.2003.1227027}, interhash = {6e33580e0dcec63242b2a20380e60ed9}, intrahash = {9ca8a48396b529181a59f18430bfd13c}, isbn = {0-7803-7785-0}, keywords = {dblp}, pages = {39-44}, publisher = {IEEE}, timestamp = {2016-02-02T12:50:11.000+0100}, title = {Evolution of automatic semiconductor test equipment: automatic test pattern learning, classification, optimisation and generation for power supply noise.}, url = {http://dblp.uni-trier.de/db/conf/vecims/vecims2003.html#LiauS03}, year = 2003 }