%0 Journal Article %1 journals/mr/WuY14 %A Wu, Chunlei %A Yao, Suying %D 2014 %J Microelectronics Reliability %K dblp %N 5 %P 993-999 %T A dynamic synchronization method to realize soft defect localization applied on digital and mixed-mode analog ICs in failure analysis. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#WuY14 %V 54

@article{journals/mr/WuY14, added-at = {2014-08-06T00:00:00.000+0200}, author = {Wu, Chunlei and Yao, Suying}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/271bdcefceb87c6348954bc6f0aa1dfc9/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2014.01.021}, interhash = {6bfda503ec46b3a6ba0d597e4653dac2}, intrahash = {71bdcefceb87c6348954bc6f0aa1dfc9}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 5, pages = {993-999}, timestamp = {2016-02-02T02:01:42.000+0100}, title = {A dynamic synchronization method to realize soft defect localization applied on digital and mixed-mode analog ICs in failure analysis.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#WuY14}, volume = 54, year = 2014 }