%0 Journal Article %1 journals/mr/WangGHPSW11 %A Wang, Jinhui %A Gong, Na %A Hou, Ligang %A Peng, Xiaohong %A Sridhar, Ramalingam %A Wu, Wuchen %D 2011 %J Microelectronics Reliability %K dblp %N 9-11 %P 1498-1502 %T Leakage current, active power, and delay analysis of dynamic dual Vt CMOS circuits under P-V-T fluctuations. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#WangGHPSW11 %V 51

@article{journals/mr/WangGHPSW11, added-at = {2011-12-19T00:00:00.000+0100}, author = {Wang, Jinhui and Gong, Na and Hou, Ligang and Peng, Xiaohong and Sridhar, Ramalingam and Wu, Wuchen}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2513f668aa6bf162bc4222d450c416286/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2011.06.011}, interhash = {646f9d0821ebf19aa3491f7df55be881}, intrahash = {513f668aa6bf162bc4222d450c416286}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1498-1502}, timestamp = {2016-02-02T02:00:01.000+0100}, title = {Leakage current, active power, and delay analysis of dynamic dual Vt CMOS circuits under P-V-T fluctuations.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#WangGHPSW11}, volume = 51, year = 2011 }