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%0 Journal Article
%1 Schnitzler_TED2025
%A Schnitzler, R.
%A Koch, D.
%A Fink, T.
%A Weiser, M.
%A Kallfass, I.
%D 2025
%J IEEE Trans. on Electron Devices
%K imported
%T A Comprehensive Impact-Evaluation of Gate Switching Instability on Switching Losses in SiC MOSFETs
@article{Schnitzler_TED2025,
added-at = {2025-05-26T10:46:09.000+0200},
author = {Schnitzler, R. and Koch, D. and Fink, T. and Weiser, M. and Kallfass, I.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2590076acf12dc42f5047e7800244d991/ingmarkallfass},
date-added = {2025-03-22 12:33:50 +0100},
date-modified = {2025-03-22 12:35:07 +0100},
interhash = {153e401872e85099ea203a21532dd9eb},
intrahash = {590076acf12dc42f5047e7800244d991},
journal = {IEEE Trans. on Electron Devices},
keywords = {imported},
timestamp = {2025-05-26T10:46:09.000+0200},
title = {A Comprehensive Impact-Evaluation of Gate Switching Instability on Switching Losses in SiC MOSFETs},
year = 2025
}
