%0 Journal Article %1 journals/mr/YanKFLYDRC11 %A Yan, Ran %A Kranti, Abhinav %A Ferain, Isabelle %A Lee, Chi-Woo %A Yu, Ran %A Dehdashti, Nima %A Razavi, Pedram %A Colinge, Jean-Pierre %D 2011 %J Microelectronics Reliability %K dblp %N 7 %P 1166-1171 %T Investigation of high-performance sub-50 nm junctionless nanowire transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#YanKFLYDRC11 %V 51

@article{journals/mr/YanKFLYDRC11, added-at = {2011-07-04T00:00:00.000+0200}, author = {Yan, Ran and Kranti, Abhinav and Ferain, Isabelle and Lee, Chi-Woo and Yu, Ran and Dehdashti, Nima and Razavi, Pedram and Colinge, Jean-Pierre}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2335b3f655412708c3451ebb37eaeefd4/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2011.02.016}, interhash = {52ff0456635d8c8c516ed4b5b6c9766e}, intrahash = {335b3f655412708c3451ebb37eaeefd4}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 7, pages = {1166-1171}, timestamp = {2016-02-02T02:01:46.000+0100}, title = {Investigation of high-performance sub-50 nm junctionless nanowire transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#YanKFLYDRC11}, volume = 51, year = 2011 }