%0 Journal Article %1 journals/tcad/ZhongKA11 %A Zhong, Shida %A Khursheed, S. Saqib %A Al-Hashimi, Bashir M. %D 2011 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 11 %P 1719-1730 %T A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects. %U http://dblp.uni-trier.de/db/journals/tcad/tcad30.html#ZhongKA11 %V 30

@article{journals/tcad/ZhongKA11, added-at = {2011-11-07T00:00:00.000+0100}, author = {Zhong, Shida and Khursheed, S. Saqib and Al-Hashimi, Bashir M.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b520df593f7e6c896ae1b4acf9080c71/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2011.2162065}, interhash = {4c1116d2b40763a5609ea8af74e5adbc}, intrahash = {b520df593f7e6c896ae1b4acf9080c71}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 11, pages = {1719-1730}, timestamp = {2016-02-02T10:08:01.000+0100}, title = {A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad30.html#ZhongKA11}, volume = 30, year = 2011 }