%0 Journal Article %1 journals/mr/AtanassovaSP08 %A Atanassova, Elena %A Stojadinovic, Ninoslav %A Paskaleva, Albena %D 2008 %J Microelectronics Reliability %K dblp %N 8-9 %P 1193-1197 %T Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#AtanassovaSP08 %V 48

@article{journals/mr/AtanassovaSP08, added-at = {2015-02-06T00:00:00.000+0100}, author = {Atanassova, Elena and Stojadinovic, Ninoslav and Paskaleva, Albena}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fce2842166b9324164a527731d7076d5/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2008.07.006}, interhash = {4a917876f965bd03b0c06a40d3818266}, intrahash = {fce2842166b9324164a527731d7076d5}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {8-9}, pages = {1193-1197}, timestamp = {2016-02-02T02:02:10.000+0100}, title = {Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#AtanassovaSP08}, volume = 48, year = 2008 }