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%0 Journal Article
%1 journals/mr/DammannPWBQMMAWMRBBRFS09
%A Dammann, Maximilian
%A Pletschen, W.
%A Waltereit, Patrick
%A Bronner, Wolfgang
%A Quay, Rüdiger
%A Müller, S.
%A Mikulla, Michael
%A Ambacher, Oliver
%A van der Wel, P. J.
%A Murad, S.
%A Rödle, T.
%A Behtash, R.
%A Bourgeois, F.
%A Riepe, K.
%A Fagerlind, M.
%A Sveinbjörnsson, E. Ö.
%D 2009
%J Microelectronics Reliability
%K dblp
%N 5
%P 474-477
%T Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems.
%U http://dblp.uni-trier.de/db/journals/mr/mr49.html#DammannPWBQMMAWMRBBRFS09
%V 49
@article{journals/mr/DammannPWBQMMAWMRBBRFS09,
added-at = {2019-11-22T00:00:00.000+0100},
author = {Dammann, Maximilian and Pletschen, W. and Waltereit, Patrick and Bronner, Wolfgang and Quay, Rüdiger and Müller, S. and Mikulla, Michael and Ambacher, Oliver and van der Wel, P. J. and Murad, S. and Rödle, T. and Behtash, R. and Bourgeois, F. and Riepe, K. and Fagerlind, M. and Sveinbjörnsson, E. Ö.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e2e413491c5154eab1f29322c49407ba/dblp},
ee = {https://doi.org/10.1016/j.microrel.2009.02.005},
interhash = {49d8a48c83e4c85efbaea23651032a2a},
intrahash = {e2e413491c5154eab1f29322c49407ba},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 5,
pages = {474-477},
timestamp = {2019-11-26T07:53:13.000+0100},
title = {Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#DammannPWBQMMAWMRBBRFS09},
volume = 49,
year = 2009
}
