%0 Journal Article %1 journals/et/SinanogluBO03 %A Sinanoglu, Ozgur %A Bayraktaroglu, Ismet %A Orailoglu, Alex %D 2003 %J J. Electronic Testing %K dblp %N 4 %P 457-467 %T Reducing Average and Peak Test Power Through Scan Chain Modification. %U http://dblp.uni-trier.de/db/journals/et/et19.html#SinanogluBO03 %V 19

@article{journals/et/SinanogluBO03, added-at = {2009-03-22T00:00:00.000+0100}, author = {Sinanoglu, Ozgur and Bayraktaroglu, Ismet and Orailoglu, Alex}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f41fc8934bf121550c52eda498a9abab/dblp}, ee = {http://dx.doi.org/10.1023/A:1024600311740}, interhash = {4994fc2ec5ee3e848c17c705fd8e1169}, intrahash = {f41fc8934bf121550c52eda498a9abab}, journal = {J. Electronic Testing}, keywords = {dblp}, number = 4, pages = {457-467}, timestamp = {2016-02-02T10:07:24.000+0100}, title = {Reducing Average and Peak Test Power Through Scan Chain Modification.}, url = {http://dblp.uni-trier.de/db/journals/et/et19.html#SinanogluBO03}, volume = 19, year = 2003 }