%0 Conference Paper %1 conf/dsn/TanDGBL17 %A Tan, Li %A DeBardeleben, Nathan %A Guan, Qiang %A Blanchard, Sean %A Lang, Michael %B DSN Workshops %D 2017 %I IEEE Computer Society %K dblp %P 91-98 %T RSVP: Soft Error Resilient Power Savings at Near-Threshold Voltage Using Register Vulnerability. %U http://dblp.uni-trier.de/db/conf/dsn/dsn2017w.html#TanDGBL17 %@ 978-1-5386-2272-8

@inproceedings{conf/dsn/TanDGBL17, added-at = {2018-08-13T00:00:00.000+0200}, author = {Tan, Li and DeBardeleben, Nathan and Guan, Qiang and Blanchard, Sean and Lang, Michael}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/280682f2c9389a9271921ca62fe7346fd/dblp}, booktitle = {DSN Workshops}, crossref = {conf/dsn/2017w}, ee = {http://doi.ieeecomputersociety.org/10.1109/DSN-W.2017.19}, interhash = {431d51df1af4c77d3e269be8931c5222}, intrahash = {80682f2c9389a9271921ca62fe7346fd}, isbn = {978-1-5386-2272-8}, keywords = {dblp}, pages = {91-98}, publisher = {IEEE Computer Society}, timestamp = {2019-09-27T20:14:02.000+0200}, title = {RSVP: Soft Error Resilient Power Savings at Near-Threshold Voltage Using Register Vulnerability.}, url = {http://dblp.uni-trier.de/db/conf/dsn/dsn2017w.html#TanDGBL17}, year = 2017 }