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%0 Journal Article
%1 journals/mr/Martin-MartinezGRNACPG07
%A Martín-Martínez, Javier
%A Gerardin, Simone
%A Rodríguez, Rosana
%A Nafría, Montserrat
%A Aymerich, Xavier
%A Cester, Andrea
%A Paccagnella, Alessandro
%A Ghidini, G.
%D 2007
%J Microelectronics Reliability
%K dblp
%N 9-11
%P 1349-1352
%T Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.
%U http://dblp.uni-trier.de/db/journals/mr/mr47.html#Martin-MartinezGRNACPG07
%V 47
@article{journals/mr/Martin-MartinezGRNACPG07,
added-at = {2015-02-05T00:00:00.000+0100},
author = {Martín-Martínez, Javier and Gerardin, Simone and Rodríguez, Rosana and Nafría, Montserrat and Aymerich, Xavier and Cester, Andrea and Paccagnella, Alessandro and Ghidini, G.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29e6451eb775d94389f32c43bf528eb53/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2007.07.088},
interhash = {3809c9e62491aa5a5f9389e7dc048af7},
intrahash = {9e6451eb775d94389f32c43bf528eb53},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = {9-11},
pages = {1349-1352},
timestamp = {2016-02-02T02:02:10.000+0100},
title = {Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#Martin-MartinezGRNACPG07},
volume = 47,
year = 2007
}