%0 Journal Article %1 journals/mr/LinLFC08 %A Lin, Chao-Ming %A Lin, Tzu-Chao %A Fang, Te-Hua %A Chao, Kuo-Sheng %D 2008 %J Microelectronics Reliability %K dblp %N 7 %P 1087-1092 %T Failure analysis of pad-height effects in the fine-pitch interconnection of the anisotropic conductive films. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#LinLFC08 %V 48

@article{journals/mr/LinLFC08, added-at = {2010-09-27T00:00:00.000+0200}, author = {Lin, Chao-Ming and Lin, Tzu-Chao and Fang, Te-Hua and Chao, Kuo-Sheng}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/263b32ecb9dbe2ea0e4409c4cd593c08e/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2008.03.014}, interhash = {35d838cf8bf9cd6d39610c85c0678436}, intrahash = {63b32ecb9dbe2ea0e4409c4cd593c08e}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 7, pages = {1087-1092}, timestamp = {2016-02-02T02:02:35.000+0100}, title = {Failure analysis of pad-height effects in the fine-pitch interconnection of the anisotropic conductive films.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#LinLFC08}, volume = 48, year = 2008 }