%0 Journal Article %1 journals/jcst/WangHHLZ07 %A Wang, Wei %A Hu, Yu %A Han, Yinhe %A Li, Xiaowei %A Zhang, You-Sheng %D 2007 %J J. Comput. Sci. Technol. %K dblp %N 5 %P 673-680 %T Leakage Current Optimization Techniques During Test Based on Don't Care Bits Assignment. %U http://dblp.uni-trier.de/db/journals/jcst/jcst22.html#WangHHLZ07 %V 22

@article{journals/jcst/WangHHLZ07, added-at = {2012-12-06T00:00:00.000+0100}, author = {Wang, Wei and Hu, Yu and Han, Yinhe and Li, Xiaowei and Zhang, You-Sheng}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26dcdcbf273be482eb68b057c8d7574f5/dblp}, ee = {http://dx.doi.org/10.1007/s11390-007-9091-x}, interhash = {35d7531de5ff5382ed5d7752000712d1}, intrahash = {6dcdcbf273be482eb68b057c8d7574f5}, journal = {J. Comput. Sci. Technol.}, keywords = {dblp}, number = 5, pages = {673-680}, timestamp = {2016-02-02T01:23:08.000+0100}, title = {Leakage Current Optimization Techniques During Test Based on Don't Care Bits Assignment.}, url = {http://dblp.uni-trier.de/db/journals/jcst/jcst22.html#WangHHLZ07}, volume = 22, year = 2007 }