%0 Journal Article %1 journals/mr/AtanassovaNSPS14 %A Atanassova, Elena %A Novkovski, N. %A Spassov, D. %A Paskaleva, Albena %A Skeparovski, A. %D 2014 %J Microelectronics Reliability %K dblp %N 2 %P 381-387 %T Time-dependent-dielectric-breakdown characteristics of Hf-doped Ta2O5/SiO2 stack. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#AtanassovaNSPS14 %V 54

@article{journals/mr/AtanassovaNSPS14, added-at = {2015-02-06T00:00:00.000+0100}, author = {Atanassova, Elena and Novkovski, N. and Spassov, D. and Paskaleva, Albena and Skeparovski, A.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a2b2d0be91f397fe5ca021acc8471f74/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2013.10.008}, interhash = {30e7611a6da3bee711ec09dfb20cf03b}, intrahash = {a2b2d0be91f397fe5ca021acc8471f74}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 2, pages = {381-387}, timestamp = {2016-02-02T01:59:36.000+0100}, title = {Time-dependent-dielectric-breakdown characteristics of Hf-doped Ta2O5/SiO2 stack.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#AtanassovaNSPS14}, volume = 54, year = 2014 }