%0 Conference Paper %1 conf/dft/ChandraA08 %A Chandra, Vikas %A Aitken, Robert C. %B DFT %D 2008 %E Bolchini, Cristiana %E Kim, Yong-Bin %E Gizopoulos, Dimitris %E Tehranipoor, Mohammad %I IEEE Computer Society %K dblp %P 114-122 %T Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS. %U http://dblp.uni-trier.de/db/conf/dft/dft2008.html#ChandraA08 %@ 978-0-7695-3365-0

@inproceedings{conf/dft/ChandraA08, added-at = {2014-11-10T00:00:00.000+0100}, author = {Chandra, Vikas and Aitken, Robert C.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2335e82757f3933abfe9a678141152866/dblp}, booktitle = {DFT}, crossref = {conf/dft/2008}, editor = {Bolchini, Cristiana and Kim, Yong-Bin and Gizopoulos, Dimitris and Tehranipoor, Mohammad}, ee = {http://doi.ieeecomputersociety.org/10.1109/DFT.2008.50}, interhash = {3035a9a4ad52f23c769a5f7a5cdc6740}, intrahash = {335e82757f3933abfe9a678141152866}, isbn = {978-0-7695-3365-0}, keywords = {dblp}, pages = {114-122}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T12:13:58.000+0100}, title = {Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2008.html#ChandraA08}, year = 2008 }