%0 Journal Article %1 journals/mr/RahimoRFVKCGBBB16 %A Rahimo, Munaf %A Richter, Frank %A Fischer, Fabian %A Vemulapati, Umamaheswara %A Kopta, Arnost %A Corvasce, Chiara %A Geissmann, Silvan %A Bellini, Marco %A Bayer, Martin J. %A Bauer, Friedhelm %D 2016 %J Microelectronics Reliability %K dblp %P 51-57 %T The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. %U http://dblp.uni-trier.de/db/journals/mr/mr58.html#RahimoRFVKCGBBB16 %V 58

@article{journals/mr/RahimoRFVKCGBBB16, added-at = {2016-05-09T00:00:00.000+0200}, author = {Rahimo, Munaf and Richter, Frank and Fischer, Fabian and Vemulapati, Umamaheswara and Kopta, Arnost and Corvasce, Chiara and Geissmann, Silvan and Bellini, Marco and Bayer, Martin J. and Bauer, Friedhelm}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2639f4215bb4f6391fd390b3a875ad7d2/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2015.12.021}, interhash = {2cd10e684460f8d803628f20e4043f80}, intrahash = {639f4215bb4f6391fd390b3a875ad7d2}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {51-57}, timestamp = {2016-05-10T09:31:59.000+0200}, title = {The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr58.html#RahimoRFVKCGBBB16}, volume = 58, year = 2016 }