%0 Journal Article %1 journals/it/BeckerPHSW06 %A Becker, Bernd %A Polian, Ilia %A Hellebrand, Sybille %A Straube, Bernd %A Wunderlich, Hans-Joachim %D 2006 %J it - Information Technology %K dblp %N 5 %P 304- %T DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems). %U http://dblp.uni-trier.de/db/journals/it/it48.html#BeckerPHSW06 %V 48

@article{journals/it/BeckerPHSW06, added-at = {2007-07-27T00:00:00.000+0200}, author = {Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b217ee345afee58f269f82cd5e898d2c/dblp}, ee = {http://dx.doi.org/10.1524/itit.2006.48.5.304}, interhash = {23c6b51d937c42bdf46abcf8de93dd06}, intrahash = {b217ee345afee58f269f82cd5e898d2c}, journal = {it - Information Technology}, keywords = {dblp}, number = 5, pages = {304-}, timestamp = {2016-02-02T10:23:47.000+0100}, title = {DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems).}, url = {http://dblp.uni-trier.de/db/journals/it/it48.html#BeckerPHSW06}, volume = 48, year = 2006 }