%0 Conference Paper %1 conf/vts/SpinnerPEBKC08 %A Spinner, Stefan %A Polian, Ilia %A Engelke, Piet %A Becker, Bernd %A Keim, Martin %A Cheng, Wu-Tung %B VTS %D 2008 %I IEEE Computer Society %K dblp %P 181-186 %T Automatic Test Pattern Generation for Interconnect Open Defects. %U http://dblp.uni-trier.de/db/conf/vts/vts2008.html#SpinnerPEBKC08 %@ 978-0-7695-3123-6

@inproceedings{conf/vts/SpinnerPEBKC08, added-at = {2014-11-05T00:00:00.000+0100}, author = {Spinner, Stefan and Polian, Ilia and Engelke, Piet and Becker, Bernd and Keim, Martin and Cheng, Wu-Tung}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/208ed24aacf6a6961267ec6e2832d2c72/dblp}, booktitle = {VTS}, crossref = {conf/vts/2008}, ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.30}, interhash = {20f19b67c94acf7d4d1572b926a53a67}, intrahash = {08ed24aacf6a6961267ec6e2832d2c72}, isbn = {978-0-7695-3123-6}, keywords = {dblp}, pages = {181-186}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T13:39:17.000+0100}, title = {Automatic Test Pattern Generation for Interconnect Open Defects.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2008.html#SpinnerPEBKC08}, year = 2008 }