%0 Journal Article %1 journals/mr/JiangWWS16 %A Jiang, Yuanyuan %A Wang, Youren %A Wu, Yi %A Sun, Quan %D 2016 %J Microelectronics Reliability %K dblp %P 167-177 %T Fault prognostic of electronics based on optimal multi-order particle filter. %U http://dblp.uni-trier.de/db/journals/mr/mr62.html#JiangWWS16 %V 62

@article{journals/mr/JiangWWS16, added-at = {2016-07-12T00:00:00.000+0200}, author = {Jiang, Yuanyuan and Wang, Youren and Wu, Yi and Sun, Quan}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/236ddea5f51cc247861e6c20be5d45c30/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2016.03.030}, interhash = {1eb3ca1dc439bfe3bb1b534899e6dd62}, intrahash = {36ddea5f51cc247861e6c20be5d45c30}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {167-177}, timestamp = {2016-07-13T09:32:03.000+0200}, title = {Fault prognostic of electronics based on optimal multi-order particle filter.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr62.html#JiangWWS16}, volume = 62, year = 2016 }