%0 Journal Article %1 journals/et/PascaAB12 %A Pasca, Vladimir %A Anghel, Lorena %A Benabdenbi, Mounir %D 2012 %J J. Electronic Testing %K dblp %N 6 %P 817-829 %T Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis. %U http://dblp.uni-trier.de/db/journals/et/et28.html#PascaAB12 %V 28

@article{journals/et/PascaAB12, added-at = {2012-12-10T00:00:00.000+0100}, author = {Pasca, Vladimir and Anghel, Lorena and Benabdenbi, Mounir}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27dc76e850cfbafc5ad2aef6957b73802/dblp}, ee = {http://dx.doi.org/10.1007/s10836-012-5322-3}, interhash = {1e60cb1c66de49d2d4daf493cc4f0b80}, intrahash = {7dc76e850cfbafc5ad2aef6957b73802}, journal = {J. Electronic Testing}, keywords = {dblp}, number = 6, pages = {817-829}, timestamp = {2016-02-02T10:07:31.000+0100}, title = {Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis.}, url = {http://dblp.uni-trier.de/db/journals/et/et28.html#PascaAB12}, volume = 28, year = 2012 }